Application Note 9783
CONTROL SWITCHES
8
BIAS
TEE
HI-2303
HI-3050
A IN
0.1 μ F
CHANNEL 1
ADC
8
DATA
LATCHES
8
CHANNEL 1
DAC
A OUT
75
BIAS
TEE
75
B IN
0.1 μ F
CHANNEL 2
ADC
8
DATA
LATCHES
8
CHANNEL 2
DAC
B OUT
75
BIAS
TEE
75
C IN
0.1 μ F
CHANNEL 3
ADC
8
DATA
LATCHES
8
CHANNEL 3
DAC
C OUT
75
75
VOLTAGE
REFERENCE
CLAMP
DRIVER
CLAMP IN
CLOCK
DRIVER
CLOCK IN
FIGURE 1. FUNCTIONAL BLOCK DIAGRAM
Buffered Clock Driver
In order to ensure rated performance of the HI2303, the duty
cycle of the sample clock should be set to 50%. It must also
have low phase noise and operate at standard TTL logic levels.
It can be dif?cult to ?nd a low phase noise generator that will
provide a 50MHz squarewave at TTL logic levels. Conse-
quently, the evaluation board is designed with a logic buffer
(U2) acting as a voltage comparator to generate the sam-
pling clock for the HI2303 when a sinewave (< ± 1.5V) is
applied to the CLK input of the evaluation board. The sample
clock sinewave is AC coupled into the input of the inverter
and a discrete bias tee is used to bias the sinewave around
the trigger level of the inverter’s input. The variable resistor
varies the DC bias voltage added to the sinewave input
allowing the user to adjust the duty cycle of the sampling
clock to obtain the best performance from the ADC and to
evaluate the effects of sample clock duty cycle on the perfor-
mance of the converter. The sinewave to logic level compar-
2
ator drives a series of additional buffers that provides
isolation between the three sample clocks used on the eval-
uation board. One clock drives the ADC clock input pin
(AD_CLOCK), a second clock drives output data latches
(LATCH_CLOCK), and the last clock provides the DAC
reconstruct clock(DA_CLOCK).
Reconstruction DAC
To easily verify the performance of the ADC a reconstruction
DAC is provided. The 10-bit HI3050 triple DAC was selected
to ensure the user measures the real ADC performance
without any degradation from the reconstruct DAC. The DAC
is con?gured to convert the latched data into a 2V fullscale
output. The fullscale output can be adjusted slightly via R9.
The DAC is optimized for the fullscale output voltage of 1.8
to 2.0V so care should be exercised when operating outside
of the designed range.
相关PDF资料
HI3026EVAL EVALUATION PLATFORM HI3026
HI5746EVAL1 EVALUATION PLATFORM HI5746
HIP1011AEVAL1 EVAL BOARD PCI HOT PLUG HIP1011
HIP1011DEVAL1 EVAL BOARD PCI HOT PLUG DUAL
HIP1011EVAL1 PCI HOT PLUG EVALUATION BOARD
HIP1011EVAL2 EVAL BOARD COMPACT PCI HOT PLUG
HIP1012EVAL1 EVALUATION BOARD DUAL GENERIC
HIP1013EVAL1 EVALUATION BOARD DUAL GENERIC
相关代理商/技术参数
HI2303JCQ 制造商:Rochester Electronics LLC 功能描述:80 PQFP INDTEMP TRIPLE A/D 8BIT 50MSPS D - Bulk
HI2304 制造商:INTERSIL 制造商全称:Intersil Corporation 功能描述:Triple 8-Bit, 20 MSPS, RGB, 3-Channel D/A Converter
HI2-304-2 制造商:未知厂家 制造商全称:未知厂家 功能描述:SPST Analog Switch
HI2-304-5 制造商:未知厂家 制造商全称:未知厂家 功能描述:SPST Analog Switch
HI2304JCQ 制造商:INTERSIL 制造商全称:Intersil Corporation 功能描述:Triple 8-Bit, 20 MSPS, RGB, 3-Channel D/A Converter
HI2-305-2 制造商:未知厂家 制造商全称:未知厂家 功能描述:SPDT Analog Switch
HI2-305-5 制造商:未知厂家 制造商全称:未知厂家 功能描述:SPDT Analog Switch
HI2307 制造商:INTERSIL 制造商全称:Intersil Corporation 功能描述:Triple 10-Bit, 50 MSPS, RGB, 3-Channel D/A Converter